Design-for-Test Optimization for Low-Power Semiconductor Devices: A Survey. Journal of Global Research in Multidisciplinary Studies(JGRMS), [S. l.], v. 1, n. 8, p. 08–14, 2025. DOI: 10.5281/zenodo.16833082. Disponível em: https://saanvipublications.com/journals/index.php/jgrms/article/view/35. Acesso em: 19 aug. 2025.